MIL-STD-130N
TABLE II. Marking methods - Continued
(This table is given only as a guide. These suggested methods may not meet the needs of your application.)
NOTES:
1. Potential effects on the item to be marked should be weighed in selecting the marking method.
2. The Joint Marking Qualification Working Group (JMQWG)**, under the sponsorship of the Government Electronics and Information Association, provides a common set of IUID 2D Data Matrix mark qualification test and report data available for unrestricted
use at https://acc.dau.mil/CommunityBrowser.aspx?id=30743. The goal of this venture is to coordinate a consortium approach towards performing, publishing, and sharing non- proprietary information for the following areas:
a. IUID Marking Methods (dot peen, laser/chem etch, direct ink, label, etc)
b. Material Types & Finishes (80% common to most of Industry)
c. Environmental Criteria (80% common to most of Industry or use worst case)
* y (recommended) and N (not recommended) denotes protocol implementation consideration.
** Refer to (https://rsesc.uah.edu/DPM) for JMQWG Matrix details.
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